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    Titel :

    2005-01-0898 Nanometer Displacement Measurement Using High Magnification Diffraction Imaging


    Beteiligte:

    Kongress:

    Experiments in Automotive Engineering - Optical Techniques ; 2005 ; Detroit, Mich.


    Erschienen in:

    SAE SP ; 1957 (2005)


    Erscheinungsdatum :

    01.01.2005


    Format / Umfang :

    6 pages


    Anmerkungen:

    Held as a session of the SAE 2005 World Congress. Contains papers from a session of the SAE 2005 World Congress. Includes bibliographic references.



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Nanometer Displacement Measurement Using High Magnification Diffraction Imaging

    Chen, F. / Yang, L. X. / Harwood, P. | SAE Technical Papers | 2005


    Nanometer displacement measurement using high magnification diffraction imaging

    Chen,F. / Harwood,P. / Yang,L.X. et al. | Kraftfahrwesen | 2005


    Infrared dual-magnification telescope using diffraction optics [4340-24]

    Kerget, I. V. / Korneychik, V. L. / Kudryashov, A. A. et al. | British Library Conference Proceedings | 2000


    Absolute measurement of nanometer displacement with Fabry-Perot interferometry

    van den Berg, S.A. / van Kan, P.J.M. / Bergmans, R.H. | IEEE | 2005


    Shape Optimization of Piezo-ceramics Actuators on Displacement Magnification Mechanisms

    Furuya, Hiroshi / Ohira, Hiromichi / Kogiso, Nozomu et al. | AIAA | 2004