3-D Analysis of Scattering Losses Due to Sidewall Roughness in Microphotonic Waveguides: High Index-Contrast
CONFERENCE, Lasers & electro-optics ; 2005 ; Baltimore, MD
01.01.2005
3 pages
IEEE cat. no. 05CH37634
Aufsatz (Konferenz)
Englisch
Lasers , CLEO , Electro-optics
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British Library Online Contents | 2005
|Sidewall Roughness and Deformations in High Index-Contrast Waveguides and Photonic Crystals
British Library Conference Proceedings | 2004
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