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    Titel :

    Research on Accelerated Aging Test and Junction Temperature Detection Method of IGBT


    Beteiligte:
    Sha, Yanbei (Autor:in) / Pan, Guangze (Autor:in) / Guo, Mengxue (Autor:in) / Wei, Lu (Autor:in) / Peng, Yang (Autor:in)

    Kongress:

    International conference on electrical engineering and information technologies for rail transportion



    Erscheinungsdatum :

    01.01.2022


    Format / Umfang :

    7 pages



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch



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    Research on Accelerated Aging Test and Junction Temperature Detection Method of IGBT

    Sha, Yanbei / Pan, Guangze / Guo, Mengxue et al. | Springer Verlag | 2022


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    Zhou, Mingchao / Wang, Lei / Guo, Mengxue et al. | TIBKAT | 2022


    Design and Research of Accelerated Aging Test Platform for IGBT Power Module

    Zhou, Mingchao / Wang, Lei / Guo, Mengxue et al. | Springer Verlag | 2022