Model Results on the Radiation-Hardness of Submicron Electronics in Aeronautical Systems
U.S. Air Force T&E Days 2010 ; 2010 ; Nashville , Tennessee
01.01.2010
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Model Results on the Radiation-Hardness of Submicron Electronics in Aeronautical Systems
British Library Conference Proceedings | 2010
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|Electronics and aeronautical research
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