Program carried out by Avionics Div, Bureau of Naval Weapons, U S Navy, to achieve maximum improvement in electronic effectiveness through advanced techniques (MIEETAT) such as application of microcircuit techniques, produced by various silicon (planar epitaxial) transistor technologies, for improved reliability, lower lifetime costs, smaller sizes, lower weight, and design costs; use of digital data processing, visual fault location, modular construction, design redundancy, reliability and maintainability testing; 4 phases of program; progress made; development and features of versatile avionics test systems, (VAST).


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    Titel :

    Reliability and maintainability barrier


    Weitere Titelangaben:

    SAE -- Paper


    Beteiligte:
    Brearley, J.M. (Autor:in)

    Kongress:

    SAE Meeting ; 1964 Electronic equipment



    Erscheinungsdatum :

    1964


    Format / Umfang :

    5 pages


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


    The Reliability and Maintainability Barrier

    Brearley, J. M. | SAE Technical Papers | 1964


    Reliability and maintainability

    Online Contents | 1994


    Reliability and maintainability

    Howell, J. M. | TIBKAT | 1995


    Reliability and Maintainability from an Airline Standpoint - ATA Reliability & Maintainability Subcommittee

    Meador, B. M. / Nowlan, F. S. / Roberson, K. D. et al. | SAE Technical Papers | 1970