Paper presents parts failure rates which resulted from operational reliability program conducted on Central Air Data Computer and Vertical Scale Systems of F-105D and F-106A and B aircraft integrated instrument system; rates, in general, compare favorably with those generated as result of other programs; however, semiconductor rates are significantly lower than other industry rates; evidence presented indicates that this is primarily due to 100% incoming inspection procedures employed by Eclipse-Pioneer Div on all semiconductors.


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    Titel :

    Parts failure rates resulting from operational reliability program


    Weitere Titelangaben:

    SAE -- Paper


    Beteiligte:
    Goggin, M.F. (Autor:in)

    Kongress:

    SAE Meeting ; 1963 Reliability



    Erscheinungsdatum :

    1963


    Format / Umfang :

    6 pages


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


    Parts Failure Rates Resulting from an Operational Reliability Program

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