PROBLEM TO BE SOLVED: To provide a semiconductor device, an electronic control unit, and a vehicle device in each of which various abnormality can be early detected.SOLUTION: A semiconductor device SIP comprises semiconductor chips CHP1, CHP2 mounted in one package. In the semiconductor chip CHP1, a current generation circuit IGEN generates a sensor current ILs that corresponds to a load current IL and a fault current Ift indicating that an abnormality detection circuit FDET has detected abnormality, and sends the one of the currents to a resistor Rcs for current detection depending on whether abnormality has been detected. In the semiconductor chip CHP2, a storage circuit MEM holds the current value of the fault current Ift obtained in the inspection process of the semiconductor device SIP as an acceptance criterion value. An arithmetic processing circuit MPU defines a specification range on the basis of the acceptance criterion value, and determines whether or not the current value represented by the digital signal of an analog-digital conversion circuit ADC is included within the specification range, i.e., whether or not abnormality is detected.SELECTED DRAWING: Figure 3
【課題】各種異常を早期に検出することが可能な半導体装置、電子制御ユニットおよび車両装置を提供する。【解決手段】半導体装置SIPは、1個のパッケージに搭載される半導体チップCHP1,CHP2を備える。半導体チップCHP1において、電流生成回路IGENは、負荷電流ILに応じたセンス電流ILsと、異常検出回路FDETが異常を検出したことを表すフォルト電流Iftとを生成し、異常の検出有無に応じて一方の電流を電流検出用抵抗Rcsに流す。半導体チップCHP2において、記憶回路MEMは、半導体装置SIPの検査工程で得られるフォルト電流Iftの電流値を判定基準値として保持する。演算処理回路MPUは、判定基準値に基づき規格範囲を定め、アナログディジタル変換回路ADCのディジタル信号が表す電流値が規格範囲内に含まれるか否か異常の検出有無を判定する。【選択図】図3
SEMICONDUCTOR DEVICE, ELECTRONIC CONTROL UNIT AND VEHICLE DEVICE
半導体装置、電子制御ユニットおよび車両装置
06.07.2017
Patent
Elektronische Ressource
Japanisch
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