A temperature abnormality detection system includes: measurement devices; and a processor to determine temperature abnormality using a first temperature T1, a second temperature T2, and a third temperature T3. The processor determines occurrence of temperature abnormality when any one of following conditions is satisfied:(A) T1>A0 or T2>A0 or T3>A0;(B) T1>A1 and (T2−T1>A4 or T2−T1<0) and T2>A2 and T3>A3;(C) T1>A1 and T2−T1>A4 and T3>A3;(D) T1>A1 and T2−T1>A4 and (T3−T2>A5 or T3−T1>A6); and(E) T1>A1 and T2−T1<0 and (T3−T2>A7 or T3−T1>A8),where A1


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    Titel :

    Temperature abnormality detection system and temperature abnormality detection method



    Medientyp :

    Patent


    Format :

    Elektronische Ressource



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