Aspects of the present disclosure provide a method generally including obtaining one or more built-in self-test (BIST) patterns, each pattern including a series of instructions, applying a compression scheme to generate one or more compressed BIST patterns, wherein the compression scheme encodes an operation and data field of instructions to generate encoded instructions, each encoded instruction having an identifier (ID) field and a variable number of data bytes, wherein the ID field identifies a type of the operation and indicates the variable number of data bytes, and storing the compressed BIST patterns.
BUILT-IN SELF-TEST ENHANCEMENTS
26.09.2024
Patent
Elektronische Ressource
Englisch
Europäisches Patentamt | 2023
|Built-in-self-test and diagnostics for microsystems
Kraftfahrwesen | 1994
|Built-in-Self-Test and Diagnostics for Microsystems
British Library Conference Proceedings | 1994
|Intermodal Transportation Enhancements through Self-Enforcing Designs
British Library Conference Proceedings | 2011
|New Built-in-Self-Test Technique for Generating Deterministic Test Pattern
British Library Online Contents | 2005
|