We have designed, fabricated, and optically measured several different nano-scale metamaterials. We employ e-beam nano-lithography technology at LBNL's CXRO for fabricating these structures on extremely thin SiN substrates so that they are close to free-standing. Optical properties were measured as a function of incidence angle and polarization using the ALS synchrotron IR beamlines. We directly observe strong magnetic resonances consistent with negative magnetic permeability in our samples at THz through near-IR optical frequencies. We will compare the results to detailed simulations. Finally, we will report on our progress towards constructing a negative index of refraction nano-scale metamaterial.


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    Titel :

    Nano-scale Metamaterials: Fabrication and Optical Measurements from THz towards visible


    Beteiligte:
    Hao, Zhao (Autor:in) / Martin, Michael C. (Autor:in) / Harteneck, Bruce (Autor:in) / Liddle, Alex (Autor:in)


    Erscheinungsdatum :

    01.09.2006


    Format / Umfang :

    1203619 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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