We present a dual semiconductor laser system at telecom wavelengths generating pulses below 300 fs. The low-jitter temporal delay of up to 2 ns is achieved electrically by a phase shifter enabling pump-probe measurements within short time.
Low jitter 1.55 /spl mu/m dual semiconductor laser system with electrical phase shifter for quick ultrafast measurements
(CLEO). Conference on Lasers and Electro-Optics, 2005. ; 3 ; 1781-1783 Vol. 3
01.01.2005
1105818 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
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