In view of the deficiency that the existing detection device can not verify its functional integrity with both adjustable main frequency and voltage, this paper designs an ESAM(Embedded Secure Access Module) chip detection device that adopts wide-voltage high-speed MCU(Micro Control Unit) control. The device can adjust the SPI frequency and working voltage of ESAM chip through wide-voltage and high-speed MCU, and then test the integrity of the function of ESAM chip under different SPI (Serial Peripheral Interface) frequency and working voltage. In addition, the working voltage of ESAM chip can be zero with wide-voltage high-speed MCU, causing backflow current, which can verify whether the phenomenon will trigger the function abnormality of ESAM chip.


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    Titel :

    A kind of ESAM chip batch inspection device controlled by the wide-voltage high-speed MCU


    Beteiligte:
    Rui, Nie (Autor:in) / Weihua, Xie (Autor:in) / Zhiqiang, Wang (Autor:in) / Zhaoqing, Liang (Autor:in) / Jia, Liu (Autor:in) / Shengbo, Qu (Autor:in)


    Erscheinungsdatum :

    20.10.2021


    Format / Umfang :

    1275014 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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