We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen


    Exportieren, teilen und zitieren



    Titel :

    NASA Goddard Space Flight Center’s Compendium of Recent Single Event Effects Results


    Beteiligte:
    M. V. O'Bryan (Autor:in) / K. A. Label (Autor:in) / E. P. Wilcox (Autor:in) / D. Chen (Autor:in) / E. J. Wyrwas (Autor:in) / M. J. Campola (Autor:in) / M. C. Casey (Autor:in) / J. Lauenstein (Autor:in) / A. D. Topper (Autor:in) / C. M. Szabo (Autor:in)

    Erscheinungsdatum :

    2018


    Format / Umfang :

    8 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




    NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

    O'Bryan, Martha V. / LaBel, Kenneth A. / Wilcox, Edward P. et al. | NTRS | 2018


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    O'Bryan, Martha V. / LaBel, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    Obryan, Martha V. / Label, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016


    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    M. V. Obryan / K. A. Label / J. A. Pellish et al. | NTIS | 2016