The rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described. (Author)


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    Titel :

    Accelerated Life Testing of Spacecraft Subsystems


    Beteiligte:
    D. Wiksten (Autor:in) / J. Swanson (Autor:in)

    Erscheinungsdatum :

    1972


    Format / Umfang :

    46 pages


    Medientyp :

    Report


    Format :

    Keine Angabe


    Sprache :

    Englisch




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