Pilot scanning dwell times and control workload in simulated instrument approach, using eye-point-of- regard /EPR/ measurements
Measurement and analysis of pilot scanning behavior during simulated instrument approaches
AMERICAN INST. OF AERONAUTICS AND ASTRONAUTICS, GUIDANCE, CONTROL AND FLIGHT MECHANICS CONFERENCE ; 1970 ; SANTA BARBARA, CA
01.08.1970
Aufsatz (Konferenz)
Keine Angabe
Englisch