Thin layers of contaminant on metal surface are detected by measuring surface-potential difference between reference electrode and surface of interest. Procedure does not require mechanical contact with surface under examination.


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    Titel :

    Detecting contamination on a metal surface


    Beteiligte:
    Harris, J. M. (Autor:in) / Marcus, H. L. (Autor:in) / Smith, T. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.03.1977



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :



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