Electro-optical probe developed to perform noncontact, nondestructive, and relatively noninvasive measurements of electric fields over broad spectrum at millimeter and shorter wavelengths in integrated circuits. Manipulated with conventional intregrated-circuit-wafer-probing equipment and operated without any special preparation of integrated circuits. Tip of probe small electro-optical crystal serving as proximity electric-field sensor.


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    Titel :

    Electro-optical Probing Of Terahertz Integrated Circuits


    Beteiligte:
    Bhasin, K. B. (Autor:in) / Romanofsky, R. (Autor:in) / Whitaker, J. F. (Autor:in) / Valdmanis, J. A. (Autor:in) / Mourou, G. (Autor:in) / Jackson, T. A. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.08.1990



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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