This paper provides a discussion of the subject and an approach to establish a reliability and qualification methodology to facilitate the utilization of state-of-the-art advanced microelectronic devices and structures in high reliability applications.
Reliability and qualification of advanced microelectronics for space applications
CANEUS Workshop on Micro-Nano Technology for Aerospace Applications
01.01.2003
Aufsatz (Konferenz)
Keine Angabe
Englisch
Reliability considerations for advanced microelectronics
NTRS | 2001
|Microelectronics and space vehicle reliability.
NTRS | 1966
|NTIS | 2017
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