In 1997, we have applied laser technology to the world's first practical adaptive cruise control (ACC) system. The ACC system is based on 2-dimensional scanning laser-radar-sensor technology that is supported by highly reliable high power diode laser. Now, we have developed 34W output power multiple-quantum-well (MQW) diode laser. The power of 870nm near IR diode laser is twice as high as conventional one, thus it meets the strong needs for robust detection of the reflective laser beams from the moving vehicle ahead. Furthermore, Au-Sn-Ni a new alloy solder has been employed to sustain high degree of vibration and thermal shock to raise reliability. The acceleration life-tests at high temperature pulsed operation demonstrate the high reliability of developed 34W high power diode laser.


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    Titel :

    Highly Reliable High Power Diode Laser for Laser Radar Application


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:
    Kato, Hisaya (Autor:in) / Abe, Katsunori (Autor:in) / Michiyama, Katsunori (Autor:in) / Atsumi, Kinya (Autor:in)

    Kongress:

    SAE 2004 World Congress & Exhibition ; 2004



    Erscheinungsdatum :

    08.03.2004




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


    Highly reliable high power diode laser for laser radar application

    Atsumi, K. / Abe, K. / Kato, H. et al. | Tema Archiv | 2004


    Highly Reliable High Power Diode Laser for Laser Radar application

    Atsumi, K. / Abe, K. / Kato, H. et al. | British Library Conference Proceedings | 2004


    Highly reliable high power diode laser for laser radar application

    Atsumi,K. / Abe,K. / Kato,H. et al. | Kraftfahrwesen | 2004


    2004-01-1594 Highly Reliable High Power Diode Laser for Laser Radar Application

    Atsumi, K. / Abe, K. / Kato, H. et al. | British Library Conference Proceedings | 2004


    Highly reliable tensile strained 810 nm QW laser diode operating at high temperatures

    Pittroff, W. / Bugge, F. / Erbert, G. et al. | IEEE | 1998