With the supply & output current (ICC, IOL, IOH) rise times inherent in today's CMOS processes, EMI problems are present even though clock frequency & output voltage switching speed may be slow. The EMI problem is first explained, then basic theory is presented with explanation on how to use it for initial design or to fix a chip so that it has reduced radiated emissions. Actual circuit designs are given which modify the ICC, IOL, and IOH waveforms without destroying functionality or performance. Substrate noise is also reduced to benefit mixing of analog and digital functions on the chip.


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    Titel :

    CMOS Chip Design for Reduced Radiated EMI Emissions


    Weitere Titelangaben:

    Sae Technical Papers


    Beteiligte:

    Kongress:

    International Congress & Exposition ; 1992



    Erscheinungsdatum :

    01.02.1992




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch


    Schlagwörter :


    CMOS chip design for reduced radiated EMI emissions

    Miller,W.E. | Kraftfahrwesen | 1992


    Radiated emissions and susceptibility-test methodology

    Moy,K.P. / Bailey,D.D. / Olin,J.G. et al. | Kraftfahrwesen | 1985