Abstract Models and methods in use for quantitative estimates of the occurrence of single event upsets in microchips of orbiting spacecraft are considered. A calculation and experimental technique for determining the rate of these effects is described, taking into account spatial and temporal distributions of the fluxes of high-energy particles in the space and their penetration through protective shields. Examples of its application for the orbit of the International Space Station are presented.


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    Titel :

    The Rate of Single Event Upsets in Electronic Circuits onboard Spacecraft


    Beteiligte:

    Erschienen in:

    Cosmic Research ; 43 , 6 ; 423-431


    Erscheinungsdatum :

    01.11.2005


    Format / Umfang :

    9 pages




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch






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    Lewkowicz, P.E. / Richter, L.J. | Tema Archiv | 1985


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    Kuznetsov, N. V. / Nymmik, R. A. / European Space Agency | British Library Conference Proceedings | 1996