The Atomic Force Microscope (AFM) has revealed itself as a reliable tool for characterizing sur face topography with nanometer resolution. In principle, a sharp tip mounted on a cantilever is brought into close proximity of a sample surface. The forces acting between the sample and the tip slightly deflect the cantilever. Scanning across the surface while recording this deflection provides a topographic image of the sample. As in most space experiments, performing microscopy measurements on a planetary mission requires a good trade-off between the experiment's weight and size and the quality and relevance of the measured data. A plain optical setup with acceptable size and weight for a space launch will provide images with limited resolution. Thus, atomic force microscopy with a well designed instrument can be complementary to an optical setup for increasing image resolution and getting higher scientific throughput. At the first glance, high sensitivity and required interaction between the instrument and the operator render the AFM unsuitable for planetary missions. However, micro-fabrication technology combined with innovative design ideas allowed us to build an error tolerant system with functionality for addressing the above mentioned challenges.


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    Titel :

    Miniaturized atomic force microscope for planetary exploration


    Weitere Titelangaben:

    Miniaturisiertes Atomkraftmikroskop zur planetarischen Erkundung


    Beteiligte:
    Gautsch, S. (Autor:in) / Staufer, U. (Autor:in) / Akiyama, T. (Autor:in) / Hidber, H.R. (Autor:in) / Tonin, A. (Autor:in) / Howald, L. (Autor:in) / Müller, D. (Autor:in) / Niedermann, P. (Autor:in) / Rooij, N.F. de (Autor:in)


    Erscheinungsdatum :

    2001


    Format / Umfang :

    6 Seiten, 11 Bilder, 6 Quellen




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Miniaturized atomic force microscope for planetary exploration

    Gautsch, S. / Staufer, U. / Akiyama, T. et al. | British Library Conference Proceedings | 2001


    Atomic Force Microscope for Planetary Applications

    Pike, W. / Hecht, M. / Akiyanna, T. et al. | NTRS | 2000



    Miniaturized Scanning Electron Microscope for In Situ Planetary Studies

    Gaskin, J. / Abbott, T. / Medley, S. et al. | British Library Conference Proceedings | 2010


    Miniaturized Raman/LIBS instrument for in situ planetary exploration

    Vogt, David / Frohmann, Sven / Schröder, Susanne et al. | Deutsches Zentrum für Luft- und Raumfahrt (DLR) | 2017

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