The effects of grain-refining additives on the morphology and surface roughness of zinc deposits plated at 80 A/dm2 is presented. Atomic force microscopy (AFM) images show zinc deposits plated without additives are rough and are not of commercial quality. The addition of a suppressor compound and a grain refiner reduces the grain size and surface roughness. Increased concentration of the grain refiner results in a further reduction of the surface roughness, the width and height of the zinc grains. AFM is a convenient way to monitor the changes in zinc morphology with additive concentrations.


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    Titel :

    Grain refinement in electrogalvanized coatings


    Beteiligte:

    Erschienen in:

    Materials Characterization ; 50 , 4-5 ; 269-274


    Erscheinungsdatum :

    2003


    Format / Umfang :

    6 Seiten, 8 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




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