As modern communication systems increasingly use frequencies above 1 GHz, the need for conducted immunity tests in this frequency range increases as well. The interference coupling in this frequency range depends on the applied test environment. The devices under test (DUT) in this work are LIN (Local Interconnect Network) bus transceivers. The LIN bus is a widely spread data bus system in modern vehicles and the number of used LIN nodes is steadily increasing. Investigations on the behavior of different boards used for direct power injection (DPI) are shown. Simulations are applied to describe the effects limiting the test frequency. Even an optimized design of the coupling path still can show bad transmission in the presence of the device(s) under test. It must therefore be considered, that good transmission of the coupling path within a 50 ohms RF characterization, as proposed in IEC62132, is no guarantee for good interference coupling during the immunity test. As result, the measurement system has to be redesigned. A proposal of a setup, disturbing a single, RF de-coupled transceiver is described.


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    Titel :

    Direct power injection immunity measurements at frequencies above 1 GHz


    Beteiligte:
    Buntz, S. (Autor:in) / Blatter, M. (Autor:in) / Leier, H. (Autor:in) / Fuchs, S. (Autor:in) / Gwisdalla, D. (Autor:in) / Menzel, W. (Autor:in)


    Erscheinungsdatum :

    2006


    Format / Umfang :

    6 Seiten, 18 Bilder, 5 Quellen


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Datenträger


    Sprache :

    Englisch




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