Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Reliability Behaviour of a Radiation Tolerant 0.6 m CMOS Technology



    Conference:

    Conference; 3rd, Electronic components ; 1997 ; Noordwijk; The Netherlands



    Publication date :

    1997-01-01


    Size :

    6 pages


    Remarks:

    Also known as EECC'97



    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Reliability Behaviour of a Radiation Tolerant 0.6 m CMOS Technology

    Courrege, J. C. / Venturin, J. L. / Bezerra, F. et al. | British Library Online Contents | 1997


    0.25mum Radiation Tolerant CMOS technology

    Rodde, K. / European Space Agency | British Library Conference Proceedings | 2002


    0.25 micron radiation tolerant CMOS technology

    Roedde, K. | Tema Archive | 2002



    Design of radiation tolerant CMOS APS system-on-a-chip image sensors

    Eid, E.-S. / Ay, S.U. / Fossum, E.R. | IEEE | 2002