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    Title :

    Reliability Behaviour of a Radiation Tolerant 0.6 m CMOS Technology


    Contributors:


    Publication date :

    1997-01-01


    Size :

    6 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    500.5 / 387.8



    Reliability Behaviour of a Radiation Tolerant 0.6 m CMOS Technology

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