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    Title :

    ESD damage simulation of integrated circuits by the consideration on parasitic parameters


    Contributors:
    Weimin, L. (author) / Dong, H. (author) / Jinghua, M. (author) / Jinsong, X. (author)


    Publication date :

    2011-01-01


    Size :

    5 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    Unknown


    Classification :

    DDC:    629.4






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