Optical near-fields are widely studied to overcome the diffraction limit of conventional optics. Near-field scanning optical microscopes (NSOM), one of the optical near-field instruments, was fabricated and improved. The shear force mechanism is used for the tip-sample distance control which is basic requirement in near-field applications. In this work, the detection mechanism and feedback control of shear force were improved by a fiber detection scheme and a digital feedback controller.


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    Title :

    Improvement of near-field scanning optical microscope and observation of optical waveguide


    Contributors:
    Ki Hyun Kim (author) / Byoungho Lee (author) / Wonho Jhe (author)


    Publication date :

    1997-01-01


    Size :

    147895 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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