Optical near-fields are widely studied to overcome the diffraction limit of conventional optics. Near-field scanning optical microscopes (NSOM), one of the optical near-field instruments, was fabricated and improved. The shear force mechanism is used for the tip-sample distance control which is basic requirement in near-field applications. In this work, the detection mechanism and feedback control of shear force were improved by a fiber detection scheme and a digital feedback controller.


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    Titel :

    Improvement of near-field scanning optical microscope and observation of optical waveguide


    Beteiligte:
    Ki Hyun Kim (Autor:in) / Byoungho Lee (Autor:in) / Wonho Jhe (Autor:in)


    Erscheinungsdatum :

    01.01.1997


    Format / Umfang :

    147895 byte





    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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