Optical near-fields are widely studied to overcome the diffraction limit of conventional optics. Near-field scanning optical microscopes (NSOM), one of the optical near-field instruments, was fabricated and improved. The shear force mechanism is used for the tip-sample distance control which is basic requirement in near-field applications. In this work, the detection mechanism and feedback control of shear force were improved by a fiber detection scheme and a digital feedback controller.
Improvement of near-field scanning optical microscope and observation of optical waveguide
01.01.1997
147895 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Improvement of Near-Field Scanning Optical Microscope and Observation of Optical Waveguide
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