Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies


    Contributors:
    J. A. Pellish (author) / P. W. Marshall (author) / A. M. Phan (author) / C. M. Seidleck (author) / K. P. Rodbell (author) / M. S. Gordon (author) / K. A. LaBel (author) / J. R. Schwank (author) / N. A. Dodds (author) / C. M. Castaneda (author)

    Publication date :

    2014


    Size :

    12 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




    Single-event upsets in highly scaled commercial SOI microprocessor

    Irom, Farokh / Farmanesh, Farhad | NTRS | 2004


    Single-Event Upsets Caused by High-Energy Protons

    Price, W. E. / Nichols, D. K. / Smith, L. S. et al. | NTRS | 1986


    Protons for Single Event Effects (SEE): Domestic U.S. Capacity and Challenges

    Kenneth A. Label / Thomas L Turflinger | NTRS | 2022


    Single event upset of dynamic RAMs by neutrons protons

    Guenzer, C.S. / Wolicki, E.A. / Allas, R.G. | Tema Archive | 1979