Holographic reticle proposed for use in nondestructive evaluation of surface irregularities. Extends inspection capability to include measurements of depth. Surfaces inspected without contamination, damage, or costly disassembly. Provides valuable information difficult to obtain. For example, surface defects as corrosion and porosity, as well as propagation of cracks, measured accurately. Roughness, wear, and plating thickness also measured. Also used to determine quality of microcircuits.
Holographic Reticle
NASA Tech Briefs ; 14 , 9
1990-09-01
Miscellaneous
No indication
English
NTRS | 1977
|Dual reticle star tracker Final project report
NTRS | 1969
STEERABLE RETICLE FOR VISOR PROJECTED HELMET MOUNTED DISPLAYS
European Patent Office | 2020
|Steerable reticle for visor projected helmet mounted displays
European Patent Office | 2022
|Beitrag zur Analyse und Simulation von Reticle-Systemen
Tema Archive | 1981
|