Holographic reticle proposed for use in nondestructive evaluation of surface irregularities. Extends inspection capability to include measurements of depth. Surfaces inspected without contamination, damage, or costly disassembly. Provides valuable information difficult to obtain. For example, surface defects as corrosion and porosity, as well as propagation of cracks, measured accurately. Roughness, wear, and plating thickness also measured. Also used to determine quality of microcircuits.


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    Titel :

    Holographic Reticle


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    01.09.1990



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Visual projection reticle

    Haines, R. F. | NTRS | 1977



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