This paper reports recent single-event effects results for a variety of microelectronic devices that include an ADC, DAC, supervisory circuit, FIFO and a Viterbi decoder. The data was collected to evaluate these devices for possible use in NASA spacecraft.
Results of Single-event Effects Measurements Conducted by the Jet Propulsion Laboratory
International Nuclear and Space Radiation Effects Conference ; 2006 ; Jacksonville, FL, United States
2006-01-01
Preprint
No indication
English