This paper reports recent single-event effects results for a variety of microelectronic devices that include an ADC, DAC, supervisory circuit, FIFO and a Viterbi decoder. The data was collected to evaluate these devices for possible use in NASA spacecraft.


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    Title :

    Results of Single-event Effects Measurements Conducted by the Jet Propulsion Laboratory


    Contributors:

    Conference:

    International Nuclear and Space Radiation Effects Conference ; 2006 ; Jacksonville, FL, United States


    Publication date :

    2006-01-01


    Type of media :

    Preprint


    Type of material :

    No indication


    Language :

    English