This paper reports recent single-event latchup results for a variety of microelectronic devices that include an digital, analog, and CMOS. The data was collected to evaluate these devices for possible use in NASA spacecraft.


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    Title :

    Results of Single-Event Latchup Measurements Conducted by the Jet Propulsion Laboratory


    Contributors:

    Conference:

    2008 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2008) ; 2008 ; Tucson, AZ, United States


    Publication date :

    2008-07-14


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English







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