Access

    Access via TIB

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Apparatus Measures Directional Reflectance Properties


    Published in:

    NASA tech briefs ; 21 , 6 ; 26-27


    Publication date :

    1997



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    BKL:    50.00 Technik allgemein: Allgemeines / 50.00 / 55.60 Raumfahrttechnik / 55.60



    Directional Reflectance Characterization Facility and

    McGuckin, B. T. / Haner, D. A. / Menzies, R. T. et al. | NTRS | 1995


    Directional Reflectance Spectroscopy of Spacecraft Materials

    Chris H. Lee / Patrick O. Seitzer / Charles M. Bachmann et al. | NTRS


    The Measurement of the Directional Hemispherical Reflectance From Spectralon

    Haner, D. A. / McGuckin, B. T. / Menzies, R. T. et al. | NTRS | 1997



    Subsystem support feasibility for formation flight measuring Bi-directional Reflectance

    Nag, Sreeja / Cahoy, Kerri / de Weck, Olivier | IEEE | 2015