An approach to estimating the radiation-stimulated failure rate in integrated circuits is suggested. It is built around the physical representation of failure mechanisms in devices exposed to ionizing radiation under actual service conditions. New capabilities for predicting the reliability and operating life of integrated circuits for space and nuclear applications are demonstrated.
The prediction of the radiation-stimulated failure rate for integrated circuits
Russian Microelectronics ; 26 , 1 ; 25-27
1997
3 Seiten, 7 Quellen
Article (Journal)
English
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