An approach to estimating the radiation-stimulated failure rate in integrated circuits is suggested. It is built around the physical representation of failure mechanisms in devices exposed to ionizing radiation under actual service conditions. New capabilities for predicting the reliability and operating life of integrated circuits for space and nuclear applications are demonstrated.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    The prediction of the radiation-stimulated failure rate for integrated circuits


    Beteiligte:
    Katerinich, I.I. (Autor:in) / Popov, V.D. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    1997


    Format / Umfang :

    3 Seiten, 7 Quellen



    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch





    Renault ADEPT method: Failure analysis and failure rate prediction

    Lemiere, B. / Francois, J.Y. | Tema Archiv | 1990


    Failure diagnosis of integrated circuits using ir laser images

    Keenan, E. / Wright, R.G. / Kirkland, L.V. | IEEE | 2003


    Failure Analysis and Rate Prediction Method

    Barbe, M. C. / CSAT | British Library Conference Proceedings | 1996


    7.1203 Failure Diagnosis of Integrated Circuits Using IR Laser Images

    Institute of Electrical and Electronics Engineers | British Library Conference Proceedings | 2003