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    Titel :

    Combined shearography and speckle pattern photography for single-access multi-component surface strain measurement [5058-44]



    Kongress:

    Conference, Optical technology and image processing for fluids and solids diagnostics ; 2002 ; Beijing



    Erscheinungsdatum :

    01.01.2003


    Format / Umfang :

    10 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch





    Evaluation of binary speckle correlation [5058-32]

    Qian, K. / Seah, H. S. / Anand, A. K. et al. | British Library Conference Proceedings | 2003


    Pseudo spackle pattern photography algorithm development and experimental calibration [5058-31]

    Fu, S. / Irving, P. E. / Furfari, D. et al. | British Library Conference Proceedings | 2003


    Evaluation and Strain Measurement of Solar Cells By Using Digital Speckle Pattern Shearography

    Ansari, M. A. / Massudi, R. / IEEE | British Library Conference Proceedings | 2005


    Nr. 5058

    DataCite | 1942