Reliability Evaluation of 1.3 Micron, Oxide-Apertured, InGaAsN VCSELs
annual meeting; 17TH, IEEE Lasers & Electro-optics Society:; LEOS 2004 ; 2004 ; Rio Grande, Puerto Rico
01.01.2004
2 pages
IEEE cat. no. 04CH37581
Aufsatz (Konferenz)
Englisch
LEOS , Lasers , Electro-optics
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