MEMS-tuned devices take on sensing and testing applications
LASER FOCUS WORLD ; 40 ; 99-105
01.01.2004
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.366 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Reliability Testing of Polysilicon for MEMS Devices
British Library Conference Proceedings | 1999
|Modeling MEMS devices for automotive applications
Kraftfahrwesen | 2005
|Modeling MEMS Devices for Automotive Applications
SAE | 2005
|Applications of MEMS devices in nanosatellite
IEEE | 2005
|Environmental Testing of MEMS for Space Applications
NTRS | 1998
|