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    Titel :

    Two- and three-dimensional vision systems for inspection, control, and metrology II : 26 - 27 October 2004, Philadelphia, Pennsylvania, USA



    Kongress:

    Conference ; 2004 ; Philadelphia, Pa. Conference (Philadelphia, Pa.) : 2004.10.26-27


    Erschienen in:

    Erscheinungsdatum :

    2004


    Format / Umfang :

    VII, 188 S


    Anmerkungen:

    Ill., graph. Darst
    Langzeitarchivierung durch Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek



    Medientyp :

    Konferenzband


    Format :

    Print


    Sprache :

    Englisch



    Klassifikation :

    DDC:    681.25




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