This system for predicting a tire failure location is provided with a tire travel parameter measurement unit, a state characteristic value measurement unit, a degree-of-fatigue characteristic value calculating unit, and a tire failure location predicting unit for predicting the location of a tire failure on the basis of the tire travel parameter and the degree-of-fatigue characteristic value of at least one tire constituent member. This method for predicting a tire failure location includes a step for measuring a tire travel parameter, a step for measuring a state characteristic value, a step for calculating a degree-of-fatigue characteristic value, and a step for predicting a tire failure location on the basis of the tire travel parameter and the degree-of-fatigue characteristic value of at least one tire constituent member.


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    System for predicting tire failure location, and method for predicting tire failure location


    Beteiligte:
    KITORA ATSUSHI (Autor:in)

    Erscheinungsdatum :

    18.04.2019


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01M TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES , Prüfen der statischen oder dynamischen Massenverteilung rotierender Teile von Maschinen oder Konstruktionen / B60C VEHICLE TYRES , Fahrzeugreifen



    SYSTEM FOR PREDICTING TIRE FAILURE LOCATION, AND METHOD FOR PREDICTING TIRE FAILURE LOCATION

    KITORA ATSUSHI | Europäisches Patentamt | 2016

    Freier Zugriff

    SYSTEM FOR PREDICTING TIRE FAILURE LOCATION, AND METHOD FOR PREDICTING TIRE FAILURE LOCATION

    KITORA ATSUSHI | Europäisches Patentamt | 2019

    Freier Zugriff

    TIRE AUTO-LOCATION SYSTEM AND TIRE AUTO-LOCATION METHOD

    TAKECHI KAZUHIRO / SHIBATA YASUHIRO | Europäisches Patentamt | 2023

    Freier Zugriff

    TIRE AUTO-LOCATION SYSTEM AND TIRE AUTO-LOCATION METHOD

    TAKECHI KAZUHIRO | Europäisches Patentamt | 2023

    Freier Zugriff