An inspection apparatus (400) uses an estimated value and an actual measured value of an alignment irregularity amount at each position in the entire traveling section of a railway vehicle to calculate a correction amount for the estimated value of the alignment irregularity amount at each position in the entire traveling section of the railway vehicle. Thereafter, the inspection apparatus (400) makes the railway vehicle travel and derives an estimated value of the alignment irregularity amount at a traveling position of the railway vehicle and corrects the estimated value by a second correction amount at this traveling position.


    Zugriff

    Download


    Exportieren, teilen und zitieren



    Titel :

    INSPECTION SYSTEM, INSPECTION METHOD, AND PROGRAM


    Weitere Titelangaben:

    INSPEKTIONSSYSTEM, INSPEKTIONSVERFAHREN UND PROGRAMM
    SYSTÈME D'INSPECTION, PROCÉDÉ D'INSPECTION, ET PROGRAMME


    Beteiligte:
    NAKAGAWA JUNICHI (Autor:in) / SHIMOKAWA YOSHIYUKI (Autor:in) / SHINAGAWA DAISUKE (Autor:in) / GOTO OSAMU (Autor:in) / MINAMI HIDEKI (Autor:in)

    Erscheinungsdatum :

    20.09.2023


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    B61L Leiten des Eisenbahnverkehrs , GUIDING RAILWAY TRAFFIC / E01B PERMANENT WAY , Gleisoberbau / B61K Andere Hilfseinrichtungen für Eisenbahnen , OTHER AUXILIARY EQUIPMENT FOR RAILWAYS



    INSPECTION SYSTEM, INSPECTION METHOD, AND PROGRAM

    NAKAGAWA JUNICHI / SHIMOKAWA YOSHIYUKI / SHINAGAWA DAISUKE et al. | Europäisches Patentamt | 2019

    Freier Zugriff

    INSPECTION SYSTEM, INSPECTION METHOD, AND PROGRAM

    NAKAGAWA JUNICHI / SHINAGAWA DAISUKE | Europäisches Patentamt | 2021

    Freier Zugriff

    INSPECTION SYSTEM, INSPECTION METHOD AND PROGRAM

    NAKAGAWA JUNICHI / SHIMOKAWA YOSHIYUKI / SHINAGAWA DAISUKE et al. | Europäisches Patentamt | 2021

    Freier Zugriff

    INSPECTION SYSTEM, INSPECTION METHOD AND PROGRAM

    NAKAGAWA JUNICHI / SHIMOKAWA YOSHIYUKI / SHINAGAWA DAISUKE et al. | Europäisches Patentamt | 2017

    Freier Zugriff

    INSPECTION SYSTEM, INSPECTION METHOD, AND PROGRAM

    NAKAGAWA JUNICHI / SHIMOKAWA YOSHIYUKI / SHINAGAWA DAISUKE et al. | Europäisches Patentamt | 2020

    Freier Zugriff